Modes Of Atomic Force Microscopy In Investigation Of The Surface Topography Of Nickel-Doped Silicon Solar Cell.

Authors

  • Adilbek Sayt-Muratovich Kulumbetov PhD student of the Department of Methods of teaching physics and astronomy Chirchik State Pedagogical University.

Keywords:

atomic force microscopy, silicon, nickel-doped silicon

Abstract

This work describes the operating modes of atomic force microscopy (AFM), as well as its application in the study of various impurity silicon. The difference between using AFM in contact and semi-contact mode is shown. It is assumed that the combined use of these two modes in the study of impurity silicon is optimal.

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Published

2023-12-28

How to Cite

Adilbek Sayt-Muratovich Kulumbetov. (2023). Modes Of Atomic Force Microscopy In Investigation Of The Surface Topography Of Nickel-Doped Silicon Solar Cell. Genius Repository, 25, 40–45. Retrieved from https://geniusrepo.net/index.php/1/article/view/443

Issue

Vol. 25 (2023): EJPCM

Section

Articles

License

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.